发明名称 Model generating apparatus, model generating system, and fault detecting apparatus
摘要 A model generating apparatus includes: a first input device for inputting process state information; a second input device for inputting test result information; a characteristic quantity extracting device for extracting a process characteristic quantity from the process state information in each of the areas; and an analyzing device for generating a process-quality model by executing an analysis of data mining using the process characteristic quantity and the test result information associated with each other. The model generating apparatus further includes: a third input device for inputting process position information so that the process position information can be associated with the process state information; and a fourth input device for inputting test position information so that the test position information can be associated with test result information.
申请公布号 US2007135957(A1) 申请公布日期 2007.06.14
申请号 US20060606383 申请日期 2006.11.30
申请人 OMRON CORPORATION 发明人 OGAWA MAKOTO;NAKAMURA TOSHIKAZU;AIKAWA YOSHIKAZU;OBAYASHI SHIGERU
分类号 G02F1/13;G05B19/418;G06F19/00;G06Q10/04;G06Q50/00;G06Q50/04;H01L21/02 主分类号 G02F1/13
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