发明名称 Probe washing method of scanning probe microscope
摘要 A probe to which a foreign matter has adhered is pressed to a sample. At this time, between a scanner in a cantilever side and a sample base, there are relatively generated a horizontal oscillation and a vertical oscillation. By generating a suitable friction to the probe tip, the foreign matter having adhered to the tip of the probe is removed, and it can be washed.
申请公布号 US2007131249(A1) 申请公布日期 2007.06.14
申请号 US20060633333 申请日期 2006.12.04
申请人 发明人 NAKAUE TAKUYA
分类号 B08B3/12;B08B6/00;B08B7/00;G01B21/30;G01Q40/00;G01Q90/00 主分类号 B08B3/12
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