| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device inspection system, a semiconductor device inspection device, and a semiconductor device inspection program capable of shortening a shipping inspection time by elongating an inspection time for a component having an inspection failure frequently, a component lot change, a product change and a field failure component and by shortening an inspection time for a component operated stably, and preventing outflow of a defective component to a field. SOLUTION: This system is constituted by including a semiconductor device inspection analysis database B for generating an inspection content of the semiconductor device by inputting parameters into various tables, a software F for generating the inspection content of the semiconductor device A from the parameters in the various tables in the semiconductor device inspection analysis database B, and a semiconductor device inspection indication device D to which the inspection content is indicated from the semiconductor device inspection analysis database B, functioning as an inspection trigger of the semiconductor device A. COPYRIGHT: (C)2007,JPO&INPIT
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