发明名称 |
SILICON WET ETCHING METHOD USING PARYLENE MASK AND METHOD OF MANUFACTURING NOZZLE PLATE OF INKJET PRINTHEAD USING THE WET ETCHING METHOD |
摘要 |
A silicon wet etching method using a parylene mask and a method for manufacturing a nozzle plate of an inkjet printhead using the same are provided to minimize thermal defects inside of a silicon substrate generated by a thermal oxidization process by reducing the number of thermal oxidization processes for the silicon substrate. A silicon wet etching method using a parylene mask includes the steps of forming a first etching mask made of a parylene on a surface of a silicon substrate(200'), forming a first element by primarily wet etching the silicon substrate by using the first etching mask, forming a second etching mask made of a silicon oxidization film on the surface of the silicon substrate, and forming a second element by secondly wet etching the silicon substrate by using the second etching mask, wherein the silicon wet etching method forms at least two elements having a shape different from each other on the silicon substrate by at least two wet etching processes.
|
申请公布号 |
KR20070060924(A) |
申请公布日期 |
2007.06.13 |
申请号 |
KR20050121124 |
申请日期 |
2005.12.09 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JAE CHANG;LEE, CHANG SEUNG;CHUNG, JAE WOO;KIM, DUCK SU;LEE, KYO YEOL |
分类号 |
B41J2/16;B41J2/135 |
主分类号 |
B41J2/16 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|