发明名称 Method and system for temperature control of a substrate
摘要 A substrate holder for supporting a substrate in a processing system and controlling the temperature thereof is described. The substrate holder comprises a first heating element positioned in a first region for elevating the temperature of the first region. A second heating element positioned in a second region is configured to elevate the temperature in the second region. Furthermore, a first controllably insulating element is positioned below the first heating element, and is configured to control the transfer of heat between the substrate and at least one cooling element positioned therebelow in the first region. A second controllably insulating element is positioned below the second heating element and is configured to control the transfer of heat between the substrate and at least one cooling element positioned therebelow in the second region.
申请公布号 US7230204(B2) 申请公布日期 2007.06.12
申请号 US20050551236 申请日期 2005.09.27
申请人 TOKYO ELECTRON LIMITED 发明人 MITROVIC ANDREJ;TSUKAMOTO YUJI
分类号 B23K10/00;H01L21/00 主分类号 B23K10/00
代理机构 代理人
主权项
地址