发明名称 |
Compact spectroscopic ellipsometer |
摘要 |
The invention concerns a spectroscopic ellipsometer comprising: a source ( 2 ) capable of emitting a broadband ray ( 4 ), a polarizer ( 10 ) for polarizing the broadband beam (4), and for producing a polarised incident beam (12) adapted to illuminate a sample (16) according to at least a selected angle; an analyzer (24) for receiving the beam reflected (20) by the illuminated sample (16) and for producing an output beam (28) in response to said reflected beam (20); and at least a reflecting optical element (14) arranged between the source (2) and the sample (16) and/or between the sample and the sensor, and capable of focusing the incident beam (12) and/or the reflected ray (20) according to a selected spot. The ellipsometer further comprises at least a first refracting element (22) arranged between the sample (16) and the sensor and/or between the source (2) and the sample (16) to collect and focus said reflected beam and/or said incident beam, thereby enabling to provide at least a refracting element (22) and a reflecting element (14) on either side of the sample (16) and hence to place the source and the sensor on the same side relative to said spot.
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申请公布号 |
US7230701(B2) |
申请公布日期 |
2007.06.12 |
申请号 |
US20030333415 |
申请日期 |
2003.09.11 |
申请人 |
SOCIETE DE PRODUCTION ET DE RECHERCHES APPLIQUEES |
发明人 |
STEHLE JEAN-LOUIS;PIEL JEAN-PHILIPPE;BOHER PIERRE;TANTART LUC;REY JEAN-PIERRE |
分类号 |
G01J3/447;G01J4/00;G01J4/04;G01N21/21 |
主分类号 |
G01J3/447 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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