发明名称 METHOD OF MANUFACTURING A PHASE SHIFT MASK
摘要 Provided is a method of manufacturing a phase shift mask, which prevents an energy loss at side walls not to cause a difference in line width by forming the same chrome side walls at the etched portions and unetched portions of a quartz substrate. The method of manufacturing a phase shift mask comprises the steps of: forming a first photosensitive layer pattern on the upside of a transparent substrate(31); etching the transparent substrate(31) using the first photosensitive layer pattern as a mask, followed by removing the first photosensitive layer pattern; forming an opaque material(32) to cover the upper part of the etched transparent substrate(31); polishing the opaque material(32) by a chemical mechanical polishing process so as to expose the transparent substrate(31); forming a second photosensitive layer pattern to expose the transparent substrate(31) for phase shift; and etching the transparent substrate(31) in predetermined depth which does not cause a difference in line width using the second photosensitive layer pattern as a mask, followed by removing the second photosensitive layer pattern, wherein the transparent substrate contains the quartz substrate, and the opaque material contains chrome and aluminum.
申请公布号 KR20070059755(A) 申请公布日期 2007.06.12
申请号 KR20050118989 申请日期 2005.12.07
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHIN, YONG CHUL
分类号 G03F1/26 主分类号 G03F1/26
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