Dielectric constant measurement for ceramic substrates - has built in filter and metallised foil each side of specimen

摘要

The dielectric constant measurement apparatus is suitable for investigating ceramic substrates used in the construction of microwave circuits. A pot-shaped holder (1) contains a base plug of dielectric material (4). The upper surface is covered by a thin metallised foil (3) of dielectric material on which rests the ceramic wafer (5) under test. A further metallised foil (6) is placed on top of the ceramic specimen and the components are held together under pressure by a metal plate and a suitable compression device. Coaxial input/output connectors are provided, the centre conductors allowing connection to the microwave circuit on the ceramic substrate. A suitable filter for use with the measuring equipment can be etched into the metallised foil (3) in contact with the circuit.