发明名称 Method of manufacturing a gas flow meter
摘要 A gas flowmeter capable of reducing a secular change comprises a silicon semiconductor substrate formed with a cavity and a heat element formed above the cavity of the semiconductor substrate by way of an insulating film. The heat element is a silicon (Si) semiconductor thin film impurity-doped at high concentration. Stoichiometrically stable silicon nitride (Si<SUB>3</SUB>N<SUB>4</SUB>) thin films as barrier layers which less permeate and less absorb hydrogen in the heat generating temperature range of the heat element are formed above and below the silicon (Si) semiconductor thin film.
申请公布号 US7228614(B2) 申请公布日期 2007.06.12
申请号 US20050088175 申请日期 2005.03.24
申请人 HITACHI CAR ENGINEERING CO., LTD. 发明人 YAMADA MASAMICHI;HORIE JUNICHI;WATANABE IZUMI;NAKADA KEIICHI
分类号 H04R31/00;F02D35/00;G01F1/684;G01F1/692 主分类号 H04R31/00
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