发明名称 THIN FILM TRANSISTOR AND METHOD OF MANUFACTURING SAME
摘要 PROBLEM TO BE SOLVED: To provide a thin film transistor for reducing a leakage current, and a method of manufacturing the thin film transistor. SOLUTION: The thin film transistor is provided with: a flexible substrate 100; a diffusion preventing layer 110 formed on the flexible substrate 100; buffer layers 120 formed by laminating at least two insulating materials on the diffusion preventing layer 110; a semiconductor layer 130 formed by having a channel layer 130a and source/drain regions 130b on a region of one of the buffer layers 120; a gate insulating layer 140 formed on the buffer layers 120 including the semiconductor layer 130; a gate electrode 150 formed in a region corresponding to the channel layer 130a on the gate insulating layer 140; an interlayer dielectric 160 formed on the gate insulating layer 140 containing the gate electrode 150; and source/drain electrodes 180a, 180b which are formed to have a predetermined contact hole 170 for exposing at least one region of the source/drain regions 130b to the interlayer dielectric 160 and to be connected with the source/drain regions 130b. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007142367(A) 申请公布日期 2007.06.07
申请号 JP20060221947 申请日期 2006.08.16
申请人 SAMSUNG SDI CO LTD 发明人 JEONG JAE KYEONG;SHIN HYUN SOO;KWON SE YEOUL;MO YEON-GON
分类号 H01L29/786;G02F1/1333;G02F1/1368;H01L21/20;H01L21/336 主分类号 H01L29/786
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