发明名称 PULSED-CONTINUOUS ETCHING
摘要 <p>In a system and method of etching a sample disposed in an etching chamber, a plurality of separately stored charges of an etching gas is discharged, one at a time, into an etching chamber in which a sample to be etched is disposed. The discharge of each charge of etching gas is terminated while there is a sufficient amount of etching gas remaining to support a desired flow of etching gas into the etching chamber. During discharge of at least one charge of etching gas, at least one previously discharged charges of etching gas is recharged. The process of discharging a plurality of separately stored charges of an etching gas, one at a time, and recharging at least one previously discharged charges of etching gas during the discharge of at least one charge of etching gas continues until the sample is etched to a desired extent.</p>
申请公布号 WO2007064812(A2) 申请公布日期 2007.06.07
申请号 WO2006US45879 申请日期 2006.11.30
申请人 XACTIX, INC.;LEBOUITZ, KYLE, S.;SPRINGER, DAVID, L. 发明人 LEBOUITZ, KYLE, S.;SPRINGER, DAVID, L.
分类号 H01L21/311 主分类号 H01L21/311
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