发明名称 |
IN SITU GROWTH OF OXIDE AND SILICON LAYERS |
摘要 |
An in-situ growth of oxide and silicon layers is provided to prevent contamination of a critical epitaxial layer by forming a protective oxide on the epitaxial layer within the same chamber. A semiconductor substrate is loaded into a cold wall chemical vapor deposition chamber designed to process one semiconductor substrate at once(100). An epitaxial layer containing silicon is formed on the substrate within the chamber(108). The epitaxial layer is exposed to oxidant source gas within the chamber. An etchant containing fluorine is introduced into the chamber to clean oxidized residue of silane in the chamber. The chemical vapor deposition chamber has total volume capacity of less than 60 liters. |
申请公布号 |
KR20070057720(A) |
申请公布日期 |
2007.06.07 |
申请号 |
KR20070036875 |
申请日期 |
2007.04.16 |
申请人 |
ASM AMERICA, INC. |
发明人 |
FERRO ARMAND;RAAIJMAKERS IVO;FOSTER DERRICK |
分类号 |
H01L21/20;C23C16/44;C23C16/48;C30B25/02;H01L21/205;H01L21/28;H01L21/31;H01L21/311;H01L21/316;H01L21/336 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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