发明名称 Multibeam type scanning microscope
摘要 A multibeam type scanning microscope that has N beams, wherein the system is devised so that the respective beams perform scanning in L<SUP>M </SUP>stages in the Y direction at maximum magnification where the discrete scanning direction is the Y direction, thus performing scanning in an area of NxL<SUP>M </SUP>stages overall, and scanning is controlled so that the following processes (1) and (2) are successively repeated L<SUP>K </SUP>times at a magnification that is 1/L<SUP>K </SUP>times the maximum magnification. Here, L, M and N are integers of 2 or greater, and K is a natural number. (1) The respective beams perform scanning in the Y direction at a sampling interval that is L<SUP>K </SUP>times that at the maximum magnification. (2) When scanning of L<SUP>M-K </SUP>stages is completed in the Y direction, and the repetition is less than the L<SUP>K</SUP>th time, the scanning skips ((N-1)xL<SUP>M-K</SUP>+1) stages.
申请公布号 US2007127003(A1) 申请公布日期 2007.06.07
申请号 US20060633384 申请日期 2006.12.04
申请人 NIKON CORPORATION 发明人 AIKAWA NAOSHI
分类号 G03B27/42 主分类号 G03B27/42
代理机构 代理人
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