| 摘要 |
Automatic test equipment for printed circuit boards or other electronic systems in which a scanning means selects one of a number of test points on the board and feeds a signal sensed therefrom to a testing circuit also fed with parameters defining acceptable values for the test point and provided by a programme, the equipment having a master programme defining all available tests and functions and an object programme defining which of those functions and values are required for a particular point under test, the master programme, during an equipment programming phase, making available each function as an enquiry to an operator and data relevant to a particular test being entered by the operator as a response to compile a complete object test programme. |
