发明名称 Semiconductor test apparatus and performance board
摘要 The gain of a buffer provided in a performance board can be adjusted. A performance board 10 of a semiconductor test apparatus (image sensor tester) 1 a comprises buffers 11 - 1 to 11 -n for driving cables, and switches 12 - 1 to 12 -n for switching between the input of a measurement signal output from a device under measurement and the input of a reference signal output from a reference-signal generator 40 . During calibration, the switches 12 - 1 to 12 -n are turned to terminals b to which the reference signal is input, such that the reference signal is applied to the buffers 11 - 1 to 11 -n. Then, the gains of the buffers 11 - 1 to 11 -n are corrected so that the output of an analog capture board 20 a has a desired value.
申请公布号 US2007126455(A1) 申请公布日期 2007.06.07
申请号 US20060598956 申请日期 2006.11.14
申请人 YOSHIDA KENJI 发明人 YOSHIDA KENJI
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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