发明名称 Semiconductor integrated circuit and method of manufacturing the same
摘要 Conventional capacitors constituted of a FET incur degradation in frequency response. A semiconductor integrated circuit includes a semiconductor substrate, an N-type FET, a P-type FET, and capacitors. The N-type FET includes N-type impurity diffusion layers, a P-type impurity-implanted region, a gate insulating layer, and a gate electrode. The P-type FET includes P-type impurity diffusion layers, an N-type impurity-implanted region, a gate insulating layer, and a gate electrode. The capacitor includes N-type impurity diffusion layers, an N-type impurity-implanted region, a capacitance insulating layer, and an upper electrode. The capacitor includes P-type impurity diffusion layers, a P-type impurity-implanted region, a capacitance insulating layer, and an upper electrode.
申请公布号 US2007126031(A1) 申请公布日期 2007.06.07
申请号 US20060607000 申请日期 2006.12.01
申请人 NEC ELECTRONICS CORPORATION 发明人 OHKUBO HIROAKI;NAKASHIBA YASUTAKA
分类号 H01L29/76 主分类号 H01L29/76
代理机构 代理人
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