发明名称 Testable design methodology for clock domain crossing
摘要 A design methodology to debug synchronization of a signal crossing clock domains. A testable synchronization control logic utilizes a programmable register to set parameters to test signals traversing from one clock domain to another clock domain across a synchronization circuit. The register is programmed with a latency value that corresponds to a correct synchronization timing for the clock domain crossing. Other bit entries in the register provide setting of other debug parameters and indications of monitored results.
申请公布号 US2007130492(A1) 申请公布日期 2007.06.07
申请号 US20050294761 申请日期 2005.12.02
申请人 JAMKHANDI PIYUSH 发明人 JAMKHANDI PIYUSH
分类号 G01R31/28;G06F11/00 主分类号 G01R31/28
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