发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME |
摘要 |
PROBLEM TO BE SOLVED: To solve the problem that defects are caused by an insufficient accuracy and flexure or the like of a mask used at the time of evaporation coating since microfabrication of a pixel region accompanying elevated fineness and enlargement of a substrate accompanying enlargement of a display area are advanced. SOLUTION: By using a photomask or a reticle installed with an auxiliary pattern with a function of light intensity reduction, which consists of diffraction grating pattern or semi-translucent film, a barrier rib having portions with different heights is formed on pixel electrodes (also called first electrodes) in a display region and around a pixel electrode layer. COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007141821(A) |
申请公布日期 |
2007.06.07 |
申请号 |
JP20060281161 |
申请日期 |
2006.10.16 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
KUWABARA HIDEAKI;ONUMA HIDETO |
分类号 |
H05B33/22;H01L51/50;H05B33/04;H05B33/10;H05B33/12 |
主分类号 |
H05B33/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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