发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
摘要 PROBLEM TO BE SOLVED: To solve the problem that defects are caused by an insufficient accuracy and flexure or the like of a mask used at the time of evaporation coating since microfabrication of a pixel region accompanying elevated fineness and enlargement of a substrate accompanying enlargement of a display area are advanced. SOLUTION: By using a photomask or a reticle installed with an auxiliary pattern with a function of light intensity reduction, which consists of diffraction grating pattern or semi-translucent film, a barrier rib having portions with different heights is formed on pixel electrodes (also called first electrodes) in a display region and around a pixel electrode layer. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007141821(A) 申请公布日期 2007.06.07
申请号 JP20060281161 申请日期 2006.10.16
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 KUWABARA HIDEAKI;ONUMA HIDETO
分类号 H05B33/22;H01L51/50;H05B33/04;H05B33/10;H05B33/12 主分类号 H05B33/22
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