发明名称 Lithographic apparatus and device manufacturing method
摘要 A method of configuring a transfer of an image of a pattern onto a substrate with a lithographic apparatus is presented. The method includes selecting a plurality of parameters including a pupil filter parameter; calculating an image of the pattern for the selected parameters; calculating a metric that represents a variation of an attribute of the calculated image over a process range; and adjusting the plurality of parameters based on a result of the metric.
申请公布号 EP1793279(A2) 申请公布日期 2007.06.06
申请号 EP20060256105 申请日期 2006.11.29
申请人 ASML NETHERLANDS BV 发明人 CHEN, ALEK CHI-HENG;HANSEN, STEVEN GEORGE
分类号 G03F7/20;G03F1/00 主分类号 G03F7/20
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