发明名称 |
Non-outgassing low activation energy resist |
摘要 |
Numerous embodiments of a method to prevent outgassing from a low activation energy photoresist are described. In one embodiment of the present invention, a photoresist material is dispensed over a substrate to form a photoresist layer. The photoresist layer includes branched polymers coupled with acetal or ketal linkages. An exposed portion of the photoresist layer is exposed to a radiation treatment to cleave the acetal or ketal linkages and separate the branched polymers. The photoresist layer is baked at a temperature below about 100° C., and the separated branched polymers are too large to outgass from the photoresist layer.
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申请公布号 |
US7226718(B2) |
申请公布日期 |
2007.06.05 |
申请号 |
US20050228589 |
申请日期 |
2005.09.15 |
申请人 |
INTEL CORPORATION |
发明人 |
CAO HEIDI B.;YUEH WANG;ROBERTS JEANETTE M. |
分类号 |
G03F7/039;G03F7/30;G03F7/38 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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