发明名称 Test apparatus, timing generator and program therefor
摘要 There is provided a test apparatus including a PLL circuit for generating a strobe signal of which the timing is shifted according to a given delay control voltage, a variable delay circuit being provided divergently from a path connecting the PLL circuit and the timing comparator and delaying the strobe signal according to the predetermined phase difference of the strobe signal for the output signal, and a first phase comparing unit for comparing a phase of the strobe signal output from the variable delay circuit and a phase of the output signal output from the device under test and supplying the delay control voltage according to the phase difference to the PLL circuit.
申请公布号 US7228248(B2) 申请公布日期 2007.06.05
申请号 US20050222681 申请日期 2005.09.09
申请人 ADVANTEST CORPORATION 发明人 OCHI TAKASHI;CHIBA NORIAKI
分类号 G06F19/00 主分类号 G06F19/00
代理机构 代理人
主权项
地址