发明名称 |
Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe |
摘要 |
There is provided a contact probe that is smaller than 50 mum in a pitch between a signal electrode and a ground electrode and can correctly conduct a high-speed high-frequency measurement, a measuring pad used for the contact probe, and a method of manufacturing the contact probe. The contact probe includes: a tip member having a signal electrode 10 a and a ground electrode 11 a that are put into contact with an object to be measured; and a coaxial cable 1 having a core 1 b electrically connected to the signal electrode 10 a and an outer covering conductor la electrically connected to the ground electrode 11 a, wherein the tip member is formed on a printed wiring board 2 , and wherein the signal electrode 10 a and the ground electrode 11 a are constructed of fine coplanar strip lines formed on an insulating board 2 a.
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申请公布号 |
US7227352(B2) |
申请公布日期 |
2007.06.05 |
申请号 |
US20060602240 |
申请日期 |
2006.11.21 |
申请人 |
KIYOTA MANUFACTURING CO. |
发明人 |
AOYAGI MASAHIRO;NAKAGAWA HIROSHI;TOKORO KAZUHIKO;KIKUCHI KATSUYA;OKADA YOSHIKUNI;KIYOTA SHIGEO |
分类号 |
G01R31/02;G01R1/067;H01R43/00;H05K1/02;H05K1/11 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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