发明名称 |
Testing head contact probe with an eccentric contact tip |
摘要 |
A contact probe for a testing head effective to test a plurality of semiconductor-integrated electronic devices comprises a rod-like probe body having a cross section of prefixed contour and provided in correspondence with at least one end with an eccentric contact tip. The contact tip is positioned within the contour of the cross section of the probe body.
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申请公布号 |
US7227368(B2) |
申请公布日期 |
2007.06.05 |
申请号 |
US20050090970 |
申请日期 |
2005.03.24 |
申请人 |
TECHNOPROBE S.P.A. |
发明人 |
CRIPPA GIUSEPPE;FELICI STEFANO |
分类号 |
G01R31/02;G01R1/067;G01R1/073 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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