发明名称 Program, test apparatus and testing method
摘要 A recording medium has a program recorded to operate a testing apparatus for testing an electronic device. The program causes the testing apparatus to perform functions as a comparing unit for comparing an output signal from the electronic device with an expected value, a timing generating unit for generating a rate signal and providing the comparing unit with the rate signal, wherein the rate signal determines timing at which the comparing unit compares the output signal with the expected value, a fail memory for saving the comparison results obtained by comparing the output signal with the expected value successively according to the rate signal to different addresses, and a period calculating unit for calculating a period of the output signal based on the comparison results stored successively in the fail memory, when executing a test for measuring the period of the output signal.
申请公布号 US7228475(B2) 申请公布日期 2007.06.05
申请号 US20040954727 申请日期 2004.09.30
申请人 ADVANTEST CORPORATION 发明人 FURUMI SHINJI
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址