发明名称 ORGANIC FILM CHEMICAL MECHANICAL POLISHING SLURRY, CHEMICAL MECHANICAL POLISHING METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 Provided is chemical mechanical polishing slurry, which ensures planarization of an organic film, inhibits scratch generation, reduces interconnection resistance, and imparts a high interconnection yield to a semiconductor fabricating process. The chemical mechanical polishing slurry comprises: polymer particles(17) having surface functionalities and a water-soluble polymer. The semiconductor fabricating process comprises the steps of: forming an insulation layer on a wafer; forming trenches in the insulation layer; forming a bottom layer, an intermediate layer and a resist layer successively on the insulation layer having trenches; exposing the resist layer to form a pattern. In the step of forming a bottom layer, an organic layer(9) is formed so that the trenches are embedded therein, and then the organic layer is subjected to chemical mechanical polishing using the slurry to perform planarization of the organic layer.
申请公布号 KR20070057009(A) 申请公布日期 2007.06.04
申请号 KR20060118781 申请日期 2006.11.29
申请人 JSR CORPORATION;KABUSHIKI KAISHA TOSHIBA 发明人 SHIDA HIROTAKA;MATSUI YUKITERU;SHIGETA ATSUSHI;HIRASAWA SHINICHI;KATO HIROKAZU;KINOSHITA MASAKO;NISHIOKA TAKESHI;YANO HIROYUKI
分类号 C09K3/14;B24B37/00;H01L21/304 主分类号 C09K3/14
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