| 摘要 |
A device for measuring a thermal property by a point-heating measurement and a method thereof are provided to measure a local thermal property of a sample by using a thermoelectric probe. A device for measuring a thermal property by point-heating measurement includes a pair of thermoelectric probe(10) layered with double conducting film for applying electricity. A lock-in amplifier is connected to a cantilever of the thermoelectric probe, applies AC current, and separates a thermoelectric voltage signal generated on the conducting film at a contacting point between the pair of thermoelectric probes and a sample. A variable resistor connects to the pair of thermoelectric probe in series and removes an operating voltage when detecting a signal. An additional resistance is connected to the variable resistor and maintains the current while probing the sample surface. A differential amplifier amplifies a thermoelectric voltage generated from the probe. |
