| 摘要 |
A calibration method and a semiconductor testing apparatus, including N drivers, N being a natural number no less than two, at least one transmission path coupled to at least one of the N drivers, at least one calibration board coupled to the at least one transmission path, N comparators, and N delay paths, such that each delay path of the N delay paths has a skew value and is coupled between the calibration board and one of the N comparators. |
