发明名称 RESIST UNDERCOAT-FORMING MATERIAL AND PATTERNING PROCESS
摘要 <p>In the lithographic multilayer resist process, a material comprising a copolymer of a hydroxy-containing vinylnaphthalene with hydroxy-free olefins is useful in forming a resist undercoat. The undercoat-forming material has a high transparency and optimum values of n and k so that it functions as an antireflective coating during short-wavelength exposure, and has etching resistance during substrate processing by etching.</p>
申请公布号 KR20070055972(A) 申请公布日期 2007.05.31
申请号 KR20060117681 申请日期 2006.11.27
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 HATAKEYAMA JUN;FUJII TOSHIHIKO
分类号 G03F7/09;G03F7/004 主分类号 G03F7/09
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