| 摘要 |
<p>The method involves inputting and/or determining optical data of a lens used for monitoring and of an optical system provided for illumination. The wavelength and/or wavelength range provided for an illumination light is inputted and/or determined. An optimal position for a structure, which is to be represented on an object, is determined from the optical data of the lens and the optical system and the wavelength and/or wavelength range. The structure is positioned in the optimal position. An emission wavelength is determined and is considered during the position determination. An independent claim is also included for a device for positioning a structure in an illumination beam path of a microscope.</p> |
