Semiconductor component test method and test devices transmits control information to unit between test device and component using a non-standard signal

摘要

A semiconductor component test method comprises a method in which to transmit information, especially control information, to a unit switched between a test device and a semiconductor component a non-standard signal is sent to the unit. Preferably the control information shows that a connection of the unit is to be in a high ohmic state, either immediately or after a given time. Independent claims are also included for the following: (A) A test unit for the above method;and (B) A unit for the test method above.