发明名称 |
NITRIDE SEMICONDUCTOR STRUCTURE, METHOD OF PRODUCING THE SAME, AND LIGHT EMITTING DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a nitride semiconductor structure with which a high-quality nitride semiconductor having less crystal dislocation density, no crack irrespective of formation of a thick nitride semiconductor and less mixed impurity can be epitaxially grown on a substrate having a lattice constant or a thermal expansion rate different from that of the nitride semiconductor without executing complicated two-stage growing, grooves of a plurality of directions are formed on the substrate to enable to promote the growing of the nitride semiconductor in a direction perpendicular to each of the grooves and to enable to reduce a piercing dislocation density. <P>SOLUTION: This nitride semiconductor structure has a substrate having a growth surface made of the same material and having a projection portion and a recess portion formed thereon; and a nitride semiconductor film grown at least on the projection portion of the growth surface. The recess portion is formed of linear grooves of a plurality of directions formed on the substrate. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007134741(A) |
申请公布日期 |
2007.05.31 |
申请号 |
JP20070015304 |
申请日期 |
2007.01.25 |
申请人 |
SHARP CORP |
发明人 |
TSUDA YUZO;YUASA TAKAYUKI |
分类号 |
H01L21/205;C23C16/02;C30B25/04;C30B29/38;H01L33/32 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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