| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory device capable of accurately detecting abnormalities during an EW operation and accurately testing an error process by outputting an operation state information indicating which of a plurality of operation stages is executed according to the progress of the operation stages. <P>SOLUTION: In the nonvolatile semiconductor memory device for executing a stored information writing or deleting operation by diving the operation into a plurality of operation stages by an internal control circuit and according to a predetermined algorithm, the internal control circuit outputs operation state information indicating which of the plurality of operation stages is executed according to the progress of the operation stages. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
