发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device and a manufacturing method thereof for controlling increase in manufacturing steps and manufacturing cost by facilitating lithography to form an element isolating region even through ultra-fine processes. <P>SOLUTION: A color insulating film 5 is formed to an internal wall of a trench TI where a trench capacitor is formed. Ions are guided to the part of the color insulating film 5 with ion implantation of an impurity into this trench TI from one diagonal direction. A part 5' of the color insulating film 5 to which the ions are guided is removed by etching utilizing difference in the etching rates. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007134470(A) 申请公布日期 2007.05.31
申请号 JP20050325580 申请日期 2005.11.10
申请人 TOSHIBA CORP 发明人 OKAJIMA MUTSUMI
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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