SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device which can markedly shorten time for testing a memory cell part with a small number of additional circuits.

SOLUTION: The semiconductor integrated circuit device has: SRAM type memory cells 11a; a memory cell arrays where the memory cells 11a are arranged repeatedly in the directions of rows and columns; a pair of bit lines 12a and 12b connected to each column in the memory cell array in common for writing complement data signal to the memory cells 11a and for reading it from the memory cells 11a; a word line WK connected to each row in the memory cell array in common; a row decoder 13 for driving the word line WK so as to select all the rows in the memory cell array when testing; and a current restriction circuit 14 connected between a main power source line and the power source of the memory cells 11a and controlled to supply current smaller than that in normal operation to the memory cell 11a when test reading.

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