发明名称 Wafer dividing method
摘要 The present invention grinds the rear surface side of a device area to form a recessed portion and an annular reinforcement part on the outer periphery of the recessed portion, removes the annular reinforcement part by grinding or cutting the rear surface of the annular reinforcement part so as to give the wafer a uniform thickness, locates the position of streets in the front surface of the wafer by infrared imaging from the rear surface side of the wafer, and after dividing the wafer into individual devices affixes dicing tape to the rear surface of the wafer divided into devices, supports the rear surface of the wafer on a dicing frame and peels a protective member off the front surface of the wafer, thereby enabling the wafer to be supported using ordinary dicing tape while posing no obstacle to device pick-up after division of the wafer.
申请公布号 US2007123002(A1) 申请公布日期 2007.05.31
申请号 US20060604210 申请日期 2006.11.27
申请人 NORIMOTO RYUJI;NAGASAWA TADATO;MASUDA TAKATOSHI 发明人 NORIMOTO RYUJI;NAGASAWA TADATO;MASUDA TAKATOSHI
分类号 H01L21/00 主分类号 H01L21/00
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