发明名称 |
WASHING LIQUID FOR PHOTOLITHOGRAPHY, AND METHOD FOR WASHING EXPOSURE DEVICE USING THE SAME |
摘要 |
<p>[PROBLEMS] To provide a washing liquid for photolithography, which, in a liquid immersion exposure process, can efficiently wash and remove contaminants of an exposure device site (particularly an optical lens part) derived from an elution component from a photoresist, can realize simple waste liquid treatment, can realize high replacement with a liquid immersion medium, and does not cause any problem with throughput in the manufacture of semiconductors, and a method for washing an exposure device using the same. [MEANS FOR SOLVING PROBLEMS] A washing liquid for photolithography for use in washing of an exposure device in a liquid immersion exposure process in which exposure is carried out in such a state that a part between the exposure device in its optical lens part and an object for exposure mounted on a wafer stage is filled with a liquid immersion medium, the washing liquid comprising (a) a surfactant, (b) a hydrocarbon solvent, and (c) water, and a method for washing an exposure device using the washing liquid.</p> |
申请公布号 |
WO2007060971(A1) |
申请公布日期 |
2007.05.31 |
申请号 |
WO2006JP323274 |
申请日期 |
2006.11.22 |
申请人 |
TOKYO OHKA KOGYO CO., LTD.;KOSHIYAMA, JUN;SAWADA, YOSHIHIRO;YOKOYA, JIRO;HIRANO, TOMOYUKI |
发明人 |
KOSHIYAMA, JUN;SAWADA, YOSHIHIRO;YOKOYA, JIRO;HIRANO, TOMOYUKI |
分类号 |
H01L21/027;C11D1/66;C11D3/43;G03F7/20;H01L21/304 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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