发明名称 WASHING LIQUID FOR PHOTOLITHOGRAPHY, AND METHOD FOR WASHING EXPOSURE DEVICE USING THE SAME
摘要 <p>[PROBLEMS] To provide a washing liquid for photolithography, which, in a liquid immersion exposure process, can efficiently wash and remove contaminants of an exposure device site (particularly an optical lens part) derived from an elution component from a photoresist, can realize simple waste liquid treatment, can realize high replacement with a liquid immersion medium, and does not cause any problem with throughput in the manufacture of semiconductors, and a method for washing an exposure device using the same. [MEANS FOR SOLVING PROBLEMS] A washing liquid for photolithography for use in washing of an exposure device in a liquid immersion exposure process in which exposure is carried out in such a state that a part between the exposure device in its optical lens part and an object for exposure mounted on a wafer stage is filled with a liquid immersion medium, the washing liquid comprising (a) a surfactant, (b) a hydrocarbon solvent, and (c) water, and a method for washing an exposure device using the washing liquid.</p>
申请公布号 WO2007060971(A1) 申请公布日期 2007.05.31
申请号 WO2006JP323274 申请日期 2006.11.22
申请人 TOKYO OHKA KOGYO CO., LTD.;KOSHIYAMA, JUN;SAWADA, YOSHIHIRO;YOKOYA, JIRO;HIRANO, TOMOYUKI 发明人 KOSHIYAMA, JUN;SAWADA, YOSHIHIRO;YOKOYA, JIRO;HIRANO, TOMOYUKI
分类号 H01L21/027;C11D1/66;C11D3/43;G03F7/20;H01L21/304 主分类号 H01L21/027
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