| 摘要 |
A probe card for a wafer test is provided to simplify the structure of the probe card itself and to obtain stable electric properties by using a needle directly contacting a PCB(Printed Circuit Board) pad. A probe card for a wafer test includes a PCB, a ring carrier, a probe block and a first reinforcing plate. The PCB(102) includes a predetermined pattern and a through hole(120). The ring carrier(104) is bent inward to support an edge portion of the PCB. The probe block(108) includes a needle fixing portion(110) for fixing a plurality of needles(112) and an insertion portion(114) capable of being inserted into the through hole of the PCB. The first reinforcing plate(106) is attached to a rear surface of the PCB in order to be connected with the insertion portion of the probe block.
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