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发明名称
晶片体电阻率检测仪器的探头固定架
摘要
俯视图与仰视图对称,省略俯视图。
申请公布号
CN3651724D
申请公布日期
2007.05.30
申请号
CN200630038482.6
申请日期
2006.06.30
申请人
上海星纳电子科技有限公司
发明人
朱洪伟
分类号
10-05
主分类号
10-05
代理机构
上海专利商标事务所有限公司
代理人
左一平
主权项
地址
201108上海市虹梅南路3609号4号楼二楼
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