发明名称 |
A method of sharing testing components for multiple embedded memories and the memory system incorporating the same |
摘要 |
<p>The present invention relates to a method of sharing testing components for multiple embedded memories and the memory system incorporating the same. The memory system includes multiple test controllers, multiple interface devices, a main controller, and a serial interface. The main controller is used for initializing testing of each of the dissimilar memory groups using a serial interface and local test controllers. The memory system results in reduced routing congestion and faster testing of plurality of dissimilar memories.</p> |
申请公布号 |
EP1791133(A1) |
申请公布日期 |
2007.05.30 |
申请号 |
EP20060124410 |
申请日期 |
2006.11.20 |
申请人 |
STMICROELECTRONICS PVT. LTD. |
发明人 |
KASHYAP, AMIT;DUBEY, PRASHANT;GARG, AKHIL |
分类号 |
G11C29/48;G11C29/14 |
主分类号 |
G11C29/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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