发明名称 Chemical-mechanical polishing apparatus and method of conditioning polishing pad
摘要 A chemical-mechanical polishing apparatus comprising at least a polishing platen, a polishing pad, a slurry supplying piping, a polishing pad conditioner, a chemical reagent supplying piping and a splitting piping is provided. The polishing platen has a plurality of slurry outlets disposed thereon and the polishing pad is disposed on the polishing platen. The slurry supplying piping is connected to the bottom of the polishing platen for delivering slurry to the surface of the polishing pad through the slurry outlets. The polishing pad conditioner is disposed over the polishing pad. The chemical reagent supplying piping is connected to the polishing pad conditioner for supplying the chemical reagent to the polishing conditioner. The splitting piping is connected between the slurry supplying piping and the chemical reagent supplying piping for providing chemical reagent to the surface of the polishing pad through the slurry supplying piping and the slurry outlets.
申请公布号 US7223157(B2) 申请公布日期 2007.05.29
申请号 US20050162120 申请日期 2005.08.30
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHEN SHENG-YU;HUNG TE-SUNG;CHENG CHUNG-JUN;CHENG CHI-PIAO;CHENG PO-YUAN
分类号 B24B5/00 主分类号 B24B5/00
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