发明名称 Ambient gas treatment of porous dielectric
摘要 A method of modifying the porosity of a thickness of a layer of porous dielectric material having a surface and formed on a semiconductor substrate is provided by exposing the porous dielectric material to a sufficient temperature in the presence of a first gas to drive moisture particles out of the pores. Modifying also includes, exposing the porous dielectric material to a radio frequency stimulus of sufficient power in the presence of a second gas to densify a thickness of the porous dielectric material to reduce or prohibit subsequent absorption of moisture or reactant gas particles by the thickness or porous dielectric material.
申请公布号 US7223705(B2) 申请公布日期 2007.05.29
申请号 US20030429984 申请日期 2003.05.06
申请人 INTEL CORPORATION 发明人 SRIRAM MANDYAM A.;O'LOUGHLIN JENNIFER
分类号 H01L21/31;H01L21/3105;H01L21/314;H01L21/316;H01L21/318;H01L21/469;H01L21/768 主分类号 H01L21/31
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