发明名称 Thermal conducting trench in a semiconductor structure
摘要 The invention relates to a trench filled with a thermally conducting material in a semiconductor substrate. In one embodiment, the semiconductor device has a trench defining a cell region, wherein a portion of the trench includes a thermally conducting material, and a contact to the thermally conducting material. The invention further relates to a semiconductor device and a method of forming a semiconductor device with an interlayer dielectric that is a thermally conducting material.
申请公布号 US7223992(B2) 申请公布日期 2007.05.29
申请号 US20060331321 申请日期 2006.01.11
申请人 INTEL CORPORATION 发明人 LIANG CHUNLIN;DOYLE BRIAN S.
分类号 H01L47/00;H01L21/762;H01L21/763;H01L23/367;H01L29/10;H01L29/417;H01L29/78 主分类号 H01L47/00
代理机构 代理人
主权项
地址