| 发明名称 |
Methods and apparatus for data analysis |
| 摘要 |
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.
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| 申请公布号 |
US7225107(B2) |
申请公布日期 |
2007.05.29 |
| 申请号 |
US20030730388 |
申请日期 |
2003.12.07 |
| 申请人 |
TEST ADVANTAGE, INC. |
发明人 |
BUXTON PAUL M.;TABOR ERIC PAUL;MARTIN EMILIO MIGUELANEZ;ZALZALA ALI M. S. |
| 分类号 |
G06F15/00;G05B23/02;G06F;G06F19/00 |
主分类号 |
G06F15/00 |
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