发明名称 Semiconductor device package with reduced leakage
摘要 A semiconductor device package comprises a container including a base and sidewalls. The base is configured to support a semiconductor device chip, and a lead frame extends through at least one of the sidewalls. A portion of the lead frame within the sidewall has at least one aperture penetrating into the lead frame. The sidewall material extends into the aperture, thereby forming a strong interfacial bond that provides a low leakage, sidewall-lead-frame interface. The base has a reentrant feature that is positioned within the thickness of at least one of the sidewalls and engages the at least one sidewall, thereby forming a low leakage base-sidewalls interface. The top surface of the base has a groove that is positioned within the thickness of at least one of the sidewalls and engages the at least one sidewall, thereby enhancing the low leakage base-sidewall interface.
申请公布号 US7224047(B2) 申请公布日期 2007.05.29
申请号 US20040015534 申请日期 2004.12.18
申请人 LSI CORPORATION 发明人 CARBERRY PATRICK JOSEPH;GILBERT JEFFERY JOHN;LIBRICZ, JR. GEORGE JOHN;MOYER RALPH SALVATORE;OSENBACH JOHN WILLIAM;SAFAR HUGO FERNANDO;SHILLING THOMAS HERBERT
分类号 H01L23/495;H01L23/02;H01L23/28;H01L23/34;H01L33/00 主分类号 H01L23/495
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