发明名称 |
METHOD OF FABRICATING SEMICONDUCTOR DEVICE HAVING BURIED GATE |
摘要 |
<p>A method for fabricating a semiconductor device having a buried gate is provided to preserve a liner formed on both sidewalls of an active region overlapped over the gate by extending the gate onto an isolation layer. An isolation trench is formed on a semiconductor substrate to define an active region(S20). A liner is formed on a sidewall of the active region(S30). An isolation layer is formed to fill the isolation trench(S40), and a hard mask pattern is formed on the substrate(S50). The substrate is etched by using the hard mask pattern as an etching mask to form a gate trench(S60). A gate is formed on the gate trench(S70), and then the hard mask pattern is removed(S80). A gate capping pattern is formed on the gate(S90).</p> |
申请公布号 |
KR100724578(B1) |
申请公布日期 |
2007.05.28 |
申请号 |
KR20060073666 |
申请日期 |
2006.08.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, BONG SOO;KIM, YUN GI;SEO, HYEOUNG WON |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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