发明名称 Scanning stage for scanning probe microscope
摘要 A scanning stage for a scanning probe microscope includes a specimen support that holds an observation specimen and a scanning mechanism that is configured to move the specimen support in X, Y, and Z directions. The specimen support is fixed to the scanning mechanism by wax.
申请公布号 US2007114441(A1) 申请公布日期 2007.05.24
申请号 US20060639116 申请日期 2006.12.14
申请人 OLYMPUS CORPORATION 发明人 UE YOSHIHIRO
分类号 G01F23/00;G01B21/30;G01Q10/00;G01Q30/08;G01Q30/20 主分类号 G01F23/00
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