发明名称 Plasma processing apparatus and method
摘要 A plasma processing apparatus includes a stage ( 3 ) on which an object ( 4 ) to be processed is to be placed, a vessel ( 1 ) which houses the stage, a conductive plate ( 24 ) which is arranged to oppose the stage, an antenna element ( 27 ) which is formed on the conductive plate, a waveguide member ( 22, 23 ) which constitutes, together with the conductive plate, a waveguide ( 21 ) which guides a high-frequency electromagnetic field to be supplied to the vessel through the antenna element, and cooling means ( 12, 31 - 35 ) for cooling the conductive plate. The conductive plate is cooled using the cooling means, so that a temperature change caused by heat generated by the conductive plate is suppressed. This can prevent the conductive plate from being deformed by the heat to change antenna characteristics. Hence, a distribution of a plasma (P) generated in the vessel is not affected by the change in the antenna characteristics, and the object to be processed arranged in the vessel can be processed uniformly.
申请公布号 US2007113978(A1) 申请公布日期 2007.05.24
申请号 US20040544632 申请日期 2004.02.04
申请人 TOKYO ELECTRON LIMITED 发明人 ISHII NOBUO;SHINOHARA KIBATSU
分类号 C23F1/00;H05H1/46;B01J19/08;C23C16/00;C23C16/511;C23F4/00;H01J37/32;H01L21/00;H01L21/205;H01L21/3065 主分类号 C23F1/00
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