发明名称 Conductor-dielectric structure and method for fabricating
摘要 A conductor-dielectric interconnect structure is fabricated by providing a structure comprising a dielectric layer having a patterned feature therein; depositing a plating seed layer on the dielectric layer in the patterned feature; depositing a sacrificial seed layer on the plating seed layer in the via; reducing the thickness of the sacrificial seed layer by reverse plating; and plating a conductive metal on the sacrificial seed layer in the patterned feature. Also provided is a dielectric layer having a via therein; a plating seed layer on the dielectric layer in the patterned feature; and a discontinuous sacrificial seed layer located in the patterned feature.
申请公布号 US2007117377(A1) 申请公布日期 2007.05.24
申请号 US20050286093 申请日期 2005.11.23
申请人 YANG CHIH-CHAO;PONOTH SHOM;RATH DAVID;WONG KEITH K H 发明人 YANG CHIH-CHAO;PONOTH SHOM;RATH DAVID;WONG KEITH K.H.
分类号 H01L21/4763 主分类号 H01L21/4763
代理机构 代理人
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