发明名称 POLISHING PROCESS FOR PRODUCING DAMAGE FREE SURFACES ON SEMI-INSULATING SILICON CARBIDE WAFERS
摘要 <p>A polishing mixture and related method of polishing a material wafer surface, such as silicon carbide, are disclosed. The polishing mixture comprises an abrasive and an oxidizer mixed in an acidic solution. Alumina may be used as the abrasive and the polishing mixture may have a pH less than or equal to seven. Subsequent to the second and third improved polishing process cycles and as shown in Figure 1C, the average roughness of the wafer surface has been reduced to 2.79A Ra.</p>
申请公布号 WO2007058774(A1) 申请公布日期 2007.05.24
申请号 WO2006US42537 申请日期 2006.11.01
申请人 THE PENN STATE RESEARCH FOUNDATION 发明人 EVERSON, WILLIAM, J.;SNYDER, DAVID;GAMBLE, RICHARD;HEYDEMANN, VOELKER, D.
分类号 H01L21/302;C09K13/00 主分类号 H01L21/302
代理机构 代理人
主权项
地址