发明名称 RINSING METHOD, DEVELOPING METHOD, DEVELOPING SYSTEM AND COMPUTER-READ STORAGE MEDIUM
摘要 The present invention provides a rinsing method capable of satisfactorily rinsing the surface of a resist film regardless of the condition of the surface of the resist film so that development defects caused by residuals produced by development may be reduced. A rinsing method of rinsing a substrate processed by a developing process for developing an exposed pattern comprises the steps of discharging a rinsing liquid onto a central part of the substrate processed by the developing process and coated with a developer puddle while the substrate is stopped or rotated (step 5 ), stopping discharging the rinsing liquid in a state where the developer puddle remains at least in a peripheral part of the substrate (step 6 ), and rotating the substrate at a high rotating speed to shake the developer remaining on the substrate off the substrate together with the rinsing liquid (step 7 ).
申请公布号 US2007116459(A1) 申请公布日期 2007.05.24
申请号 US20060554192 申请日期 2006.10.30
申请人 TOKYO ELECTRON LIMITED 发明人 TAKEGUCHI HIROFUMI;NAKAMURA JUNJI;YOSHIHARA KOUSUKE
分类号 B08B7/00;G03D5/00 主分类号 B08B7/00
代理机构 代理人
主权项
地址